Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.
Last Updated： Aggregation Period:Jul 16, 2025～Aug 12, 2025
This ranking is based on the number of page views on our site.
1～11 item / All 11 items
It is possible to measure the particle size distribution of powders.
Measurement of particle size distribution using laser diffraction method and evaluation of powder particle characteristics (such as particle size and shape) through image analysis are possible.
Identify individual salt particles! It is possible to statistically analyze particle size, surface area, and more.
The size of the particles contained within the capsule is said to be closely related to the effectiveness of the drug, and obtaining a particle size distribution is required. With a 3D X-ray microscope (X-ray CT), it is possible to non-destructively investigate the particle size distribution of internal materials by visualizing the differences in X-ray absorption rates within the object in three dimensions. In the internal observation of capsules containing salt (sodium chloride), it is possible to identify individual salt particles from the X-ray CT images of the capsule containing salt particles and statistically analyze the size and surface area of the particles. [Example] ■ Internal observation of capsules containing salt (sodium chloride) *For more details, please refer to the PDF document or feel free to contact us.
Noise that could not be captured by the spectrum analyzer is now observable.
APD (Amplitude Probability Distribution) is a statistical method that illustrates the relationship between power level and time frequency in a single graph derived from the time waveform of a signal. This measuring instrument calculates both the strength and probability of noise by measuring the time variation of noise in terms of bandwidth and time at high frequencies used in wireless communication. ● Features - Capable of observing high-order harmonic components and modulated noise. - By accurately securing the observation time, it allows for measurements of modulated waves and burst waves without omissions. - Provides measurements that correlate well with the evaluation of digital wireless communication (BER: Bit Error Rate). ■ Device Features - Measurement of electric and magnetic field distribution using APD. - The measurement area is shielded to cut unwanted external noise. - Equipped with simultaneous electric and magnetic field sensors. - Features height detection for the object being measured, making it easy to measure uneven surfaces. - Electric and magnetic field distribution measurement via spectrum. - Easy-to-understand three-dimensional display software with a stereoscopic representation. - Measurement range alignment is facilitated by a teaching box. - Utilizes a proprietary signal analysis device.
Measurement of film thickness in extremely small areas is now possible! Film thickness is calculated from the intensity of characteristic X-rays generated during electron beam irradiation.
We conduct thickness distribution measurements of thin films using EPMA. Thickness measurements of thin films are primarily performed using X-ray fluorescence and X-ray reflectivity methods. Since these methods use X-rays as the incident source, they can only measure the average thickness over a relatively wide measurement area. In contrast, by utilizing electron beams, we are now able to measure the thickness in extremely small areas (approximately 1μm²) and also perform thickness distribution mapping, so please make use of this capability. 【Features】 ■ Measurement principle: Thickness is calculated from the intensity of characteristic X-rays generated during electron beam irradiation. ■ Equipment used: EPMA ■ Spatial resolution: Approximately 1μm ■ Maximum measurable thickness: Approximately 1μm ■ Minimum mapping area: Approximately 80×80μm *For more details, please refer to the related links or feel free to contact us.
An example of measuring the stress distribution around an indentation made on SiC used in semiconductors! Analyzed with visible light laser.
Our company conducts stress distribution measurement using micro laser Raman spectroscopy. Residual stress can have various adverse effects on products, such as deformation and failure. There are several measurement methods available, and Raman spectroscopy is one effective means. In the related link, we present examples of stress distribution measurements around indentations made on SiC used in semiconductors, along with graphs and photographs. 【Features】 ■ Analysis equipment: RAMAN ■ Analysis method: Visible light laser ■ Analysis target: Raman-active materials (semiconductors, carbon, polymers, etc.) ■ Surface resolution: Approximately 1μm *For more details, please refer to the related link or feel free to contact us.
We have the measurement technology and know-how to meet various requests.
Particle size distribution measurement can be performed using laser diffraction and scattering methods, high-transmittance centrifugal sedimentation methods, acoustic methods (dry classification), and vibration methods (dry and wet classification). These methods can be conveniently used for one-time measurements or for intermittent measurements as part of quality control. You can obtain the necessary data quickly and accurately whenever needed. At the Seishin Corporation Powder Measurement Center, we possess the measurement technology and know-how to meet your needs. We pride ourselves on having the best knowledge and experience in Japan regarding powders. For more details, please download the catalog.
![[Contract Measurement] Specific Surface Area and Pore Size Distribution Measurement](https://image.mono.ipros.com/public/default/object/noimage_l.gif?w=280&h=280)
Leave it to us for specific surface area and pore distribution measurements!
The specific surface area measurement can be done using the air permeability method (in accordance with JIS 5201) and gas adsorption methods (BET single-point method and BET multi-point method). For pore distribution measurement, gas adsorption methods (BET multi-point method) and mercury intrusion methods (simultaneous pore volume measurement) are used. For example, the air permeability method involves filling a cell with a known volume of powder, maintaining a constant air volume and pressure difference, and measuring the permeation time to determine the specific surface area by comparing it with standard cement. For more details, please download the catalog.
![Measurement of 70-point foot pressure distribution [Wireless pressure distribution measurement insole]](https://image.mono.ipros.com/public/product/image/e14/2000737768/IPROS8513124559181546246.jpg?w=280&h=280)
Wireless & flexible. Demonstrating potential in various fields such as sports, healthcare, and automotive, etc. [Video available]
At Ougya Co., Ltd., we are developing the "Pressure Distribution Measurement Insole," which demonstrates potential in a wide range of fields such as sports and caregiving. We introduce an insole sensor that can measure the load distribution on the sole of the foot "in real-time." It features a thin design with a sheet thickness of 3.0mm. It is wireless, easy to use, and boasts excellent detection speed for real-time performance. This sensor can be inserted into your existing shoes to dynamically record the load distribution on the sole of the foot during walking or exercise. It is very compact and lightweight, allowing for measurement without discomfort during use. It can be utilized in various scenarios, including improving footwork and customizing insole shapes. 【Features】 ■ Capacitive detection sensor sheet ■ Thin design with a sheet thickness of 3.0mm ■ Excellent detection speed for real-time performance ■ User-friendly wireless type ■ Can be used in athletic shoes or ski boots for measuring weight transfer *For more details, please download the related catalog (PDF) or feel free to contact us.
